Implementation of X-tolerant LBIST with Adaptive Intelligence Testing

EasyChair Preprint no. 2916

Abstract

Complexed silicon chips are the foundation for everything from smartphones and wearables to self-driving cars and machines that learn. Requirements to meet ISO 26262 with Automotive Safety Integrity Levels up to ASIL D is quite challenging. Deployment of an automotive chip to provide dynamic in-system testing for critical failures and in-order to meet stringent Automotive Functional Safety requirements Advanced Intelligent Test (AIT) integration with POST and XLBIST was effective. RTL DFT integration flow allows us to verify the physically aware and power optimized placement early in design flow. XLBIST leverages its unique data reseeding approach with which observations on significant test coverage and test time improvements over regular logic BIST solution looks tremendous. This provides us an exceptional high level of in-system test fault coverage with minimal test time. AIT provides the functionality to execute autonomous and independent BIST operation on resources via IEEE 1500 network compatible.

Keyphrases: AIT, ASIL, FuSa, IEEE 1500, ISO 26262, Power Management Unit, XLBIST

@Booklet{EasyChair:2916,
  author = {Leela Krishna Thota and Ravi Teja Battala and Arun Madhavan},
  title = {Implementation of X-tolerant LBIST with Adaptive Intelligence Testing},
  howpublished = {EasyChair Preprint no. 2916},

  year = {EasyChair, 2020}}