IPP: Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

EasyChair Preprint no. 1509

Abstract

The test and design methodology currently used to develop automotive mixed-signal integrated circuits, is not sufficient to achieve the < 10 PPB quality target. In particular it does not allow to activate and detect all latent defects, which are a significant cause of vehicle failures in the field. This paper discusses whether full burn-in will be needed in order to meet the quality goal, or whether Vstress in combination with defect activation coverage methodology will do the job.

Keyphrases: activation, analog, burn-in, fault coverage, latent defects, Quality, structured test, Vstress

@Booklet{EasyChair:1509,
  author = {Wim Dobbelaere and Frederik Colle and Anthony Coyette and Ronny Vanhooren and Nektar Xama and Jhon Gomez and Georges Gielen},
  title = {IPP: Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs},
  howpublished = {EasyChair Preprint no. 1509},

  year = {EasyChair, 2019}}