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Author
:
Peter Wang
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Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice
Peter Wang
EasyChair Preprint 3572
Keyphrases
BEOL
,
Boundary Scan
,
chiplet
,
DDR
,
Interposer
,
Known-Good-Die
,
MCM
,
self-test
,
substrate
.
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