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Author
:
Geert Van der Plas
Publications
Invited Paper: Opportunities of Chip Power Integrity and Performance Improvement Through Wafer Backside (BS) Connection
Rongmei Chen
,
Giuliano Sisto
,
Odysseas Zografos
,
Dragomir Milojevic
,
Pieter Weckx
,
Geert Van der Plas
and
Eric Beyne
EasyChair Preprint 9239
Keyphrases
BEOL
,
BS-signal Routing
,
BSPDN
,
IR-drop
,
logic
,
SRAM macro
.
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